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TrenchStop(R) Series
IGP30N60T IGW30N60T
Low Loss IGBT in TrenchStop(R) and Fieldstop technology
* * * * * Very low VCE(sat) 1.5 V (typ.) Maximum Junction Temperature 175 C Short circuit withstand time - 5s Designed for : - Frequency Converters - Uninterruptible Power Supply TrenchStop(R) and Fieldstop technology for 600 V applications offers : PG-TO-220-3-1 - very tight parameter distribution - high ruggedness, temperature stable behavior - very high switching speed Positive temperature coefficient in VCE(sat) Low EMI Low Gate Charge Qualified according to JEDEC1 for target applications Pb-free lead plating; RoHS compliant Complete product spectrum and PSpice Models : http://www.infineon.com/igbt/ VCE 600V 600V IC 30A 30A VCE(sat),Tj=25C 1.5V 1.5V Tj,max 175C 175C Marking Code G30T60 G30T60 Package PG-TO-220-3-1 PG-TO-247-3
C
G
E
PG-TO-247-3
* * * * * *
Type IGP30N60T IGW30N60T
Maximum Ratings Parameter Collector-emitter voltage DC collector current, limited by Tjmax TC = 25C TC = 100C Pulsed collector current, tp limited by Tjmax Turn off safe operating area (VCE 600V, Tj 175C) Gate-emitter voltage Short circuit withstand time
2)
Symbol VCE IC
Value 600 60 30
Unit V A
ICpuls VGE tSC Ptot Tj Tstg -
90 90 20 5 187 -40...+175 -55...+175 260 V s W C
VGE = 15V, VCC 400V, Tj 150C Power dissipation TC = 25C Operating junction temperature Storage temperature Soldering temperature, 1.6mm (0.063 in.) from case for 10s
1 2)
J-STD-020 and JESD-022 Allowed number of short circuits: <1000; time between short circuits: >1s. 1 Rev. 2.6 Nov. 09
Power Semiconductors
TrenchStop(R) Series
Thermal Resistance Parameter Characteristic IGBT thermal resistance, junction - case Thermal resistance, junction - ambient RthJA PG-TO-220-3-1 PG-TO-247-3-21 RthJC Symbol Conditions
IGP30N60T IGW30N60T
Max. Value 0.80 62 40 Unit K/W
Electrical Characteristic, at Tj = 25 C, unless otherwise specified Parameter Static Characteristic Collector-emitter breakdown voltage Collector-emitter saturation voltage V ( B R ) C E S V G E = 0 V , I C =0.2mA VCE(sat) V G E = 15 V, I C =30A T j = 25C T j = 175 C Gate-emitter threshold voltage Zero gate voltage collector current VGE(th) ICES I C =0 .43mA, V C E =V G E V C E = 60 0 V, VGE=0V T j = 25C T j = 175 C Gate-emitter leakage current Transconductance Integrated gate resistor Dynamic Characteristic Input capacitance Output capacitance Reverse transfer capacitance Gate charge Internal emitter inductance measured 5mm (0.197 in.) from case Short circuit collector current
1)
Symbol
Conditions
Value min. 600 4.1 typ. 1.5 1.9 4.9 max. 2.05 5.7
Unit
V
A 16.7 40 1000 100 nA S
IGES gfs RGint
V C E = 0 V , V G E =20V V C E =20V, I C =30A
Ciss Coss Crss QGate LE IC(SC)
V C E =25V, VGE=0V, f=1MHz V C C = 48 0 V, I C =30A V G E =15V PG- TO- 220- 3-1 PG- TO- 247- 3-21 V G E =15V,t S C 5 s V C C = 400 V, T j = 1 50 C
-
1630 108 50 167 7 13 275
-
pF
nC nH A
1)
Allowed number of short circuits: <1000; time between short circuits: >1s. 2 Rev. 2.6 Nov. 09
Power Semiconductors
TrenchStop(R) Series
Switching Characteristic, Inductive Load, at Tj=25 C Parameter IGBT Characteristic Turn-on delay time Rise time Turn-off delay time Fall time Turn-on energy Turn-off energy Total switching energy td(on) tr td(off) tf Eon Eoff Ets T j = 25C , V C C = 40 0 V,I C =30A, V G E = 0 /1 5 V, R G = 1 0 .6 , L 1 ) =1 36nH, C 1 ) =39pF Energy losses include "tail" and diode reverse recovery. 2) Symbol Conditions
IGP30N60T IGW30N60T
Value min. Typ. 23 21 254 46 0.69 0.77 1.46 max. mJ Unit
ns
Switching Characteristic, Inductive Load, at Tj=175 C Parameter IGBT Characteristic Turn-on delay time Rise time Turn-off delay time Fall time Turn-on energy Turn-off energy Total switching energy td(on) tr td(off) tf Eon Eoff Ets T j = 175 C , V C C = 40 0 V,I C =30A, V G E = 0 /1 5 V, R G = 1 0 .6 L 1 ) =1 36nH, C 1 ) =39pF Energy losses include "tail" and diode reverse recovery.2) 24 26 292 90 1.0 1.1 2.1 mJ ns Symbol Conditions Value min. Typ. max. Unit
1) 2)
Leakage inductance L a nd Stray capacity C due to dynamic test circuit in Figure E. Includes Reverse Recovery Losses from IKW30N60T due to dynamic test circuit in Figure E. 3 Rev. 2.6 Nov. 09
Power Semiconductors
TrenchStop(R) Series
100A
90A 80A
IGP30N60T IGW30N60T
tp=2s 10s
IC, COLLECTOR CURRENT
IC, COLLECTOR CURRENT
70A 60A 50A 40A 30A 20A 10A 0A 100H z
10A
50s
T C =80C T C =110C
Ic
1A
DC
1ms 10ms
Ic
1kH z 10kH z 100kH z
0.1A 1V
10V
100V
1000V
f, SWITCHING FREQUENCY Figure 1. Collector current as a function of switching frequency (Tj 175C, D = 0.5, VCE = 400V, VGE = 0/+15V, RG = 10)
VCE, COLLECTOR-EMITTER VOLTAGE Figure 2. Safe operating area (D = 0, TC = 25C, Tj 175C; VGE=15V)
160W
50A
IC, COLLECTOR CURRENT
POWER DISSIPATION
40A
120W
30A
80W
20A
Ptot,
40W
10A
0W 25C
50C
75C
100C 125C 150C
0A 25C
75C
125C
TC, CASE TEMPERATURE Figure 3. Power dissipation as a function of case temperature (Tj 175C)
TC, CASE TEMPERATURE Figure 4. Collector current as a function of case temperature (VGE 15V, Tj 175C)
Power Semiconductors
4
Rev. 2.6 Nov. 09
TrenchStop(R) Series
80A 70A
50A
IGP30N60T IGW30N60T
IC, COLLECTOR CURRENT
15V 13V 11V 9V 7V
IC, COLLECTOR CURRENT
60A 50A 40A 30A 20A 10A 0A
V G E =20V
40A
V G E =20V
15V 13V
30A
11V 9V
20A
7V
10A
0A
0V
1V
2V
3V
0V
1V
2V
3V
VCE, COLLECTOR-EMITTER VOLTAGE Figure 5. Typical output characteristic (Tj = 25C)
VCE, COLLECTOR-EMITTER VOLTAGE Figure 6. Typical output characteristic (Tj = 175C)
VCE(sat), COLLECTOR-EMITT SATURATION VOLTAGE
50A
2.5V
IC =60A
IC, COLLECTOR CURRENT
40A
2.0V IC =30A
30A
1.5V
20A
1.0V
IC =15A
10A
T J = 1 7 5 C 2 5 C
0.5V
0A
0.0V
0V
2V
4V
6V
8V
0C
50C
100C
150C
VGE, GATE-EMITTER VOLTAGE Figure 7. Typical transfer characteristic (VCE=20V)
TJ, JUNCTION TEMPERATURE Figure 8. Typical collector-emitter saturation voltage as a function of junction temperature (VGE = 15V)
Power Semiconductors
5
Rev. 2.6 Nov. 09
TrenchStop(R) Series
IGP30N60T IGW30N60T
t d(off)
t d(off)
t, SWITCHING TIMES
t, SWITCHING TIMES
100ns
tf
t d(on)
tf
100ns
10ns
tr
t d(on)
tr
1ns
0A
10A
20A
30A
10ns
10
20
30
40
IC, COLLECTOR CURRENT Figure 9. Typical switching times as a function of collector current (inductive load, TJ=175C, VCE = 400V, VGE = 0/15V, RG = 10, Dynamic test circuit in Figure E)
RG, GATE RESISTOR Figure 10. Typical switching times as a function of gate resistor (inductive load, TJ = 175C, VCE= 400V, VGE = 0/15V, IC = 30A, Dynamic test circuit in Figure E)
7V 6V
t d(off)
VGE(th), GATE-EMITT TRSHOLD VOLTAGE
m ax.
5V 4V 3V 2V 1V 0V -50C
typ.
t, SWITCHING TIMES
100ns
tf
m in.
t d(on)
tr
10ns 25C
50C
75C
100C 125C 150C
0C
50C
100C
150C
TJ, JUNCTION TEMPERATURE Figure 11. Typical switching times as a function of junction temperature (inductive load, VCE = 400V, VGE = 0/15V, IC = 30A, RG=10, Dynamic test circuit in Figure E)
TJ, JUNCTION TEMPERATURE Figure 12. Gate-emitter threshold voltage as a function of junction temperature (IC = 0.43mA)
Power Semiconductors
6
Rev. 2.6 Nov. 09
TrenchStop(R) Series
*) Eon and Ets include losses due to diode recovery
IGP30N60T IGW30N60T
5.0mJ
Ets*
*) E on an d E ts in c lud e lo s se s du e to d io d e re co v ery
E ts *
3.0 m J
E, SWITCHING ENERGY LOSSES
4.0mJ
E, SWITCHING ENERGY LOSSES
3.0mJ
E off
2.0 m J
2.0mJ
Eoff
1.0 m J
1.0mJ
Eon*
E on *
0.0 m J
30A 40A 50A
0 10 20 30 40
0.0mJ 0A 10A
20A
IC, COLLECTOR CURRENT Figure 13. Typical switching energy losses as a function of collector current (inductive load, TJ = 175C, VCE = 400V, VGE = 0/15V, RG = 10, Dynamic test circuit in Figure E)
RG, GATE RESISTOR Figure 14. Typical switching energy losses as a function of gate resistor (inductive load, TJ = 175C, VCE = 400V, VGE = 0/15V, IC = 30A, Dynamic test circuit in Figure E)
2.0mJ
*) Eon and Ets include losses due to diode recovery
*) E on and E ts include losses
Ets*
3.0m J
due to diode recovery
E, SWITCHING ENERGY LOSSES
E, SWITCHING ENERGY LOSSES
1.5mJ
2.5m J 2.0m J
E ts *
1.0mJ
Eoff
1.5m J 1.0m J 0.5m J 0.0m J 300V
E on *
E off
0.5mJ
Eon*
0.0mJ 25C
50C
75C
100C 125C 150C
350V
400V
450V
500V
550V
TJ, JUNCTION TEMPERATURE Figure 15. Typical switching energy losses as a function of junction temperature (inductive load, VCE = 400V, VGE = 0/15V, IC = 30A, RG = 10, Dynamic test circuit in Figure E)
VCE, COLLECTOR-EMITTER VOLTAGE Figure 16. Typical switching energy losses as a function of collector emitter voltage (inductive load, TJ = 175C, VGE = 0/15V, IC = 30A, RG = 10, Dynamic test circuit in Figure E)
Power Semiconductors
7
Rev. 2.6 Nov. 09
TrenchStop(R) Series
IGP30N60T IGW30N60T
C iss
VGE, GATE-EMITTER VOLTAGE
1nF
15V
120V
10V
480V
c, CAPACITANCE
5V
100pF
C oss
C rss
0V 0nC 30nC 60nC 90nC 120nC 150nC 180n C
0V
10V
20V
30V
40V
QGE, GATE CHARGE Figure 17. Typical gate charge (IC=30 A)
VCE, COLLECTOR-EMITTER VOLTAGE Figure 18. Typical capacitance as a function of collector-emitter voltage (VGE=0V, f = 1 MHz)
12s
IC(sc), short circuit COLLECTOR CURRENT
400A
SHORT CIRCUIT WITHSTAND TIME
10s 8s 6s 4s 2s 0s 10V
300A
200A
tSC,
100A
0A 12V
14V
16V
18V
11V
12V
13V
14V
VGE, GATE-EMITTETR VOLTAGE Figure 19. Typical short circuit collector current as a function of gateemitter voltage (VCE 400V, Tj 150C)
VGE, GATE-EMITETR VOLTAGE Figure 20. Short circuit withstand time as a function of gate-emitter voltage (VCE=600V, start at TJ=25C, TJmax<150C)
Power Semiconductors
8
Rev. 2.6 Nov. 09
TrenchStop(R) Series
IGP30N60T IGW30N60T
ZthJC, TRANSIENT THERMAL RESISTANCE
D=0.5 0.2 10 K/W
-1
0.1 0.05
R,(K/W) 0.29566 0.25779 0.19382 0.05279
, (s) -2 6.478*10 -3 6.12*10 -4 4.679*10 -5 6.45*10
R2
0.02 10 K/W
-2
R1
0.01
C1=1/R1
C2=2/R2
single pulse
1s
10s 100s
1ms
10ms 100ms
tP, PULSE WIDTH Figure 21. IGBT transient thermal resistance (D = tp / T)
Power Semiconductors
9
Rev. 2.6 Nov. 09
TrenchStop(R) Series
PG-TO-220-3-1
IGP30N60T IGW30N60T
Power Semiconductors
10
Rev. 2.6 Nov. 09
TrenchStop(R) Series
IGP30N60T IGW30N60T
Power Semiconductors
11
Rev. 2.6 Nov. 09
TrenchStop(R) Series
i,v diF /dt
IGP30N60T IGW30N60T
tr r =tS +tF Qr r =QS +QF tr r
IF
tS QS
tF 10% Ir r m t VR
Ir r m
QF
dir r /dt 90% Ir r m
Figure C. Definition of diodes switching characteristics
1
Tj (t) p(t)
r1
r2
2
n
rn
r1
r2
rn
Figure A. Definition of switching times
TC
Figure D. Thermal equivalent circuit
Figure B. Definition of switching losses
Figure E. Dynamic test circuit
Power Semiconductors
12
Rev. 2.6 Nov. 09
TrenchStop(R) Series
IGP30N60T IGW30N60T
Published by Infineon Technologies AG 81726 Munich, Germany (c) 2008 Infineon Technologies AG All Rights Reserved.
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Information For further information on technology, delivery terms and conditions and prices, please contact the nearest Infineon Technologies Office (www.infineon.com).
Warnings Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. Infineon Technologies components may be used in life-support devices or systems only with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.
Power Semiconductors
13
Rev. 2.6 Nov. 09

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